Revue internationale de recherche et développement en pharmacie et sciences de la vie

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LOW FREQUENCY MAGNETIC FIELD INDUCES DEPRESSION BY RISING NITRIC OXIDE LEVELS IN THE MOUSE BRAIN

Balwant P. Salunke, Sudhir N. Umathe, Jagatpalsingh G. Chavan

The present study was designed to investigate the influence of Extremely low frequency magnetic field (ELF MF) on depression related behavior, and mechanism involved therein. Mice were exposed to ELF MF (50Hz, 10G) 8h/day for 7, 30, 60, 90 and 120 days. Depression was assessed using forced swim test (FST), in which no significant effect was observed on 7t h, 30t h, 60t h, 90t h exposure day. However, depression was observed on 120t h exposure day. It is evident that ELF MF exposure modulates level of nitric oxide (NO); therefore, the level of NO was measured in the regions of brain viz; cortex, striatum, hippocampus and hypothalamus. Results established that ELF MF elevated NO levels in the regions of brain. Furthermore, the implication of NO was assessed by nitric oxide synthase (NOS) inhibitors suggesting the involvement of NO in ELF MF induced depression.